American Association for Aerosol Research - Abstract Submission

AAAR 32nd Annual Conference
September 30 - October 4, 2013
Oregon Convention Center
Portland, Oregon, USA

Abstracts by Miles Owen


The Splitter Bias Measurements for Calibration of Optical Particle Sizer (OPS) Using Wafer Surface Scanner (WSS) Method for 3 μm Particles at Ultra-Low Concentrations. SHIGERU KIMOTO, Lin Li, George Mulholland, Miles Owen, David Y. H. Pui, University of Minnesota