AAAR 32nd Annual Conference
September 30 - October 4, 2013
Oregon Convention Center
Portland, Oregon, USA
Abstract View
Validation of New Fast Scanning Mobility Particle Sizing System
JAMES FARNSWORTH, Brandon Detmer, Nathan Birkeland, Fred Quant, Hans-Georg Horn, Brian Osmondson, TSI Incorporated
Abstract Number: 128 Working Group: Instrumentation and Methods
Abstract Differential mobility classification has become the measurement principle of choice for making aerosol size distribution measurements in the 1 nanometer to 1 micron range, especially since the scanning concept was introduced by Wang and Flagan in 1990. In order to met the need for faster measurements while leveraging the reliability of differential mobility classification, a new classifier (TSI Model 3082) has been developed to enable scan times down to 5s.
The 3082 classifier retains the functions of the 3080 classifier with additions such as a dual polarity, high voltage (HV) controller for the DMA with 50 ms response time for faster scanning; 50 Hz data sampling for higher time resolution (Erickson et al 2012); increased sheath flow for improved size resolution; and integrated, removable accessories (x-ray neutralizer and impactors).
Validation testing of the new fast scanning SMPS and classifier has been completed. A comprehensive review of our validation test results is presented, including measurement results obtained from scan times down to 5s, high voltage control accuracy, sheath flow rate control and accuracy, and size measurement accuracy using standard reference materials (such as PSL spheres) in compliance with the ISO 15900 Standard which recommends test methodology for differential mobility devices. Equivalence data comparing SMPS measurements using the new 3082 classifier versus the 3080 classifier will also be presented; these data demonstrate good agreement of both classifiers at traditional scanning rates as well as the advantages of the new model at reduced scan times.
Additional testing was completed to understand limitations of the device in high stress environments. Data from environmental testing such as operation in high humidity environments and stress tests such as Highly Accelerated Life Testing (HALT) will be presented.