AAAR 36th Annual Conference
October 16 - October 20, 2017
Raleigh Convention Center
Raleigh, North Carolina, USA

Abstracts by Markus Bainschab

Implications for the Sampling System in Extending Automotive Particle Regulations Below 23 nm. First Results of the DownToTen Project. PANU KARJALAINEN, Jorma Keskinen, Markus Bainschab, Alexander Bergmann, Athanasios Mamakos, Jonathan Andersson, Barouch Giechaskiel, Leonidas Ntziachristos, Zissis Samaras, Tampere University of Technology