AAAR 36th Annual Conference
October 16 - October 20, 2017
Raleigh Convention Center
Raleigh, North Carolina, USA

Abstracts by Heinz Amenitsch

In-situ Nanoparticle Characterization at Ambient Pressure by Small Angle X-Ray Scattering (SAXS). PAULUS S. BAUER, Heinz Amenitsch, Paul M. Winkler, Universitaet Wien, Vienna, Austria