AAAR 36th Annual Conference
October 16 - October 20, 2017
Raleigh Convention Center
Raleigh, North Carolina, USA

Abstracts by Andrew J. Orr-Ewing

Sensitivity of Radiative Forcing to Uncertainties in Real and Imaginary Refractive Indices as Determined from Single Trapped Particle Measurements. ANTONIO VALENZUELA, Jonathan P. Reid, Rose Willoughby, Allen E. Haddrell, Bryan R. Bzdek, Andrew J. Orr-Ewing, University of Bristol