10th International Aerosol Conference September 2 - September 7, 2018 America's Center Convention Complex St. Louis, Missouri, USA
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A Post-Correction Method to Improve the Accuracy of the Aerosol Particle Mass Analyzer
BO-XI LIAO, Chuen-Jinn Tsai, National Chiao Tung University
Abstract Number: 478 Working Group: Instrumentation
Abstract The available technique for the direct mass measurement of sub-50 nm nanoparticles is limited at the present time, restricting the characterization of the particle mass, density, and related properties. The tandem differential mobility analyzer (DMA) and aerosol particle mass analyzer (APM) provides an efficient mass measurement for submicron particles, while the lower limit of the particle size for the DMA-APM technique is restricted at about 50 nm due to the APM mass underestimation. To advance the technique for sub-50 nm nanoparticles, a post-correction method with an empirical equation according to the value of λc,P was proposed to correct the APM mass underestimation without any modification of the instrument. The correction method was applied to the mass measurement data of the silver nanoparticles measured at different APM operation conditions. It was found that the standard error of the data fitting was reduced by the correction, suggesting that the quality of the measured mass data was improved by the correction. Besides, the study also confirmed that the influence of the particle size, porosity, and morphology of nanoparticles on the accuracy of the APM should be minor.