American Association for Aerosol Research - Abstract Submission
AAAR 34th Annual Conference
October 12 - October 16, 2015
Hyatt Regency
Minneapolis, Minnesota, USA
Abstracts by Hiromu Sakurai
Experimental Verification of the Classification Accuracies for the Aerosol Particle Mass Analyzer(APM).
Nobuhiko Fukushima, YUSUKE OGIHARA, Yoshiko Murashima, Hiromu Sakurai,
AIST
Toward the Development of Particle-number Standard Wafers for Calibrating Wafer-Surface-Scanners.
Naoko Tajima, KENJIRO IIDA, Kensei Ehara, Hiromu Sakurai, Sommawan Khumpuang, Shiro Hara,
AIST
Traceable Calibration of Detection Efficiencies of Optical Particle Counters using Inkjet Aerosol Generator.
KENJIRO IIDA, Kensei Ehara, Hiromu Sakurai,
AIST