American Association for Aerosol Research - Abstract Submission
AAAR 34th Annual Conference
October 12 - October 16, 2015
Hyatt Regency
Minneapolis, Minnesota, USA
Abstracts by Sommawan Khumpuang
Toward the Development of Particle-number Standard Wafers for Calibrating Wafer-Surface-Scanners.
Naoko Tajima, KENJIRO IIDA, Kensei Ehara, Hiromu Sakurai, Sommawan Khumpuang, Shiro Hara,
AIST