AAAR 34th Annual Conference
October 12 - October 16, 2015
Hyatt Regency
Minneapolis, Minnesota, USA
Abstract View
Quantitative Measurement of Nanoparticle Concentration by Electron Microscopy Techniques
KRISTIN BUNKER, Traci Lersch, Gary Casuccio, RJ Lee Group, Inc.
Abstract Number: 473 Working Group: Nanoparticles and Materials Synthesis
Abstract As the field of nanotechnology continues to progress, there is a need to determine quantitative information on physiochemical properties of engineered nanoparticles, including size and concentration. Presently, the field is limited by the lack of standards and reference materials as well as industry accepted analytical methodologies used for characterization. For example, there is no direct way to determine nanoparticle concentration in particles/mL. Therefore, bulk chemistry techniques such as ICP-MS are used as a surrogate to determine the mass concentration of nanoparticles in solution (mg/mL) which is then converted to the desired concentration metric based on particle size data provided by electron microscopy measurements. In an attempt to provide a direct measurement of nanoparticle number concentrations, research is being performed using high-resolution electron microscopy techniques. Results including information on the development of a sample preparation technique and analysis protocols will be discussed. In addition, the quantitative electron microscopy results will be compared to other techniques used to obtain number concentration information.