AAAR 35th Annual Conference October 17 - October 21, 2016 Oregon Convention Center Portland, Oregon, USA
Abstract View
Two-Color Digital Holography: Simultaneous Particle Imaging and Scattering Pattern Measurement
MATTHEW BERG, Mississippi State Univeristy
Abstract Number: 25 Working Group: Single Aerosol Particle Studies - Techniques and Instrumentation
Abstract The recent availability of high resolution optoelectronic sensors has revived holography as a useful technique to study aerosol particles. By placing a two-dimensional detector in a collimated laser beam, the interference pattern produced by a particle in the beam can be easily measured. This pattern is the particle’s in-line hologram and useful information can be extracted from it directly. For example, applying a Fourier-transform operation yields a silhouette-like image of the particle, thus revealing its size and shape without a priori information. We will present our new laboratory work that employs two wavelengths of light and digital holography to image particles and measure their two-dimensional light scattering patterns. Both the imaging and pattern measurement are achieved simultaneously so that a particle’s scattering pattern can be unambiguously associated with its physical image.